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    ITC 55300C

    應(yīng)用于半導(dǎo)體行業(yè)：

    半導(dǎo)體測試設(shè)備

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    111111

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    美國

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     Model ITC55300C is the high current (400A) version of the ITC55100C tester. The ITC55300C performs the same tests as the ITC55100C and includes many features that improve testing accuracy, test results collection, test results viewing, and multiple tester networking. The ITC55300C has the added capability of testing dual devices; N-channel, P-channel or combination.

    Model ITC55300C performs ruggedness testing of power MOSFETs, discretes and modules and IGBTs, discretes and modules. It also tests single and dual diodes, and forward and reverse bias of IGBTs when used with an optional ITC55-RSF Output Selector Box.

    The ITC55300C performs several types of tests that conform to MIL-STD-750C Method 3470. Method 3470 tests the capability of P- and N-Channel MOSFETs and IGBTs by stressing them to controlled energy levels. This is accomplished by the devices driving an unclamped inductive load.

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